Capacitive Touch Library
Description of the Capacitive Touch Library
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Capacitive Touch Implementations

Modules

 ISR Definitions
 

Functions

void TI_CTS_RO_COMPB_TB0_WDTA_HAL (const struct Sensor *group, uint16_t *counts)
 RO method capactiance measurement using CompB, TimerB0, and WDTA.
 
void TI_CTS_fRO_CSIO_TA2_TA3_HAL (const struct Sensor *group, uint16_t *counts)
 fRO using Capacitive Touch IO, TimerA2, and TimerA3
 
void TI_CTS_RO_CSIO_TA2_TA3_HAL (const struct Sensor *group, uint16_t *counts)
 RO method using Capacitive Touch IO, TimerA2, and TimerA3.
 
void TI_CTS_RO_CSIO_TA2_WDTA_HAL (const struct Sensor *group, uint16_t *counts)
 RO method measurement using Capacitive Touch IO, TimerA2, and WDTA.
 
void TI_CTS_fRO_PINOSC_TA0_TA1_HAL (const struct Sensor *group, uint16_t *counts)
 fRO method capacitance measurement using PinOsc IO, TimerA0, and TimerA1
 
void TI_CTS_RO_PINOSC_TA0_TA1_HAL (const struct Sensor *group, uint16_t *counts)
 RO method capacitance measurement using PinOsc IO, TimerA0, and TimerA1.
 
void TI_CTS_RO_COMPAp_TA0_WDTp_HAL (const struct Sensor *group, uint16_t *counts)
 RO method capactiance measurement using CompA+, TimerA0, and WDT+.
 
void TI_CTS_fRO_COMPAp_TA0_SW_HAL (const struct Sensor *group, uint16_t *counts)
 RO method capactiance measurement using CompA+, TimerA0, and SW loop.
 
void TI_CTS_fRO_COMPAp_SW_TA0_HAL (const struct Sensor *group, uint16_t *counts)
 RO method capactiance measurement using CompA+, TimerA0, and SW loop.
 
void TI_CTS_RO_COMPAp_TA1_WDTp_HAL (const struct Sensor *group, uint16_t *counts)
 RO method capactiance measurement using CompA+, TimerA1, and WDT+.
 
void TI_CTS_fRO_COMPAp_TA1_SW_HAL (const struct Sensor *group, uint16_t *counts)
 RO method capactiance measurement using CompA+, TimerA1, and SW loop.
 
void TI_CTS_RC_PAIR_TA0_HAL (const struct Sensor *group, uint16_t *counts)
 RC method capactiance measurement using a Pair of GPIO and TimerA0.
 
void TI_CTS_fRO_PINOSC_TA0_SW_HAL (const struct Sensor *group, uint16_t *counts)
 fRO method capactiance measurement using the PinOsc and TimerA0
 
void TI_CTS_RO_PINOSC_TA0_WDTp_HAL (const struct Sensor *group, uint16_t *counts)
 RO method capactiance measurement with PinOsc IO, TimerA0, and WDT+.
 
void TI_CTS_RO_PINOSC_TA0_HAL (const struct Sensor *group, uint16_t *counts)
 RO method capactiance measurement using PinOsc IO, and TimerA0.
 
void TI_CTS_RO_COMPB_TA0_WDTA_HAL (const struct Sensor *group, uint16_t *counts)
 RO method capactiance measurement using CompB, TimerA0, and WDTA.
 
void TI_CTS_RO_COMPB_TA1_WDTA_HAL (const struct Sensor *group, uint16_t *counts)
 RO method capactiance measurement using CompB, TimerA1, and WDTA.
 
void TI_CTS_fRO_COMPB_TA0_SW_HAL (const struct Sensor *group, uint16_t *counts)
 fRO method capactiance measurement using CompB, TimerA0
 
void TI_CTS_fRO_COMPB_TA1_SW_HAL (const struct Sensor *group, uint16_t *counts)
 fRO method capactiance measurement using CompB, TimerA1
 
void TI_CTS_RO_COMPB_TA1_TA0_HAL (const struct Sensor *group, uint16_t *counts)
 RO method capacitance measurement using CompB, TimerA1, and TimerA0.
 
void TI_CTS_fRO_COMPB_TA1_TA0_HAL (const struct Sensor *group, uint16_t *counts)
 fRO method capacitance measurement using CompB, TimerA1, and TimerA0
 

Detailed Description

Function Documentation

void TI_CTS_fRO_COMPAp_SW_TA0_HAL ( const struct Sensor *  group,
uint16_t *  counts 
)

RO method capactiance measurement using CompA+, TimerA0, and SW loop.


Schematic Description of CompA+ forming relaxation oscillator.
<- Output
-> Input
R Resistor (typically 100Kohms)

                  +-<-Px.y (reference)
                  |
                  R
                  |
              +---+-->COMPA+
              |   |
              R   R                
              |   |
             GND  |
                  |  
                  |
     element-+-R--+-<-CAOUT                               
             |
             +------->COMPA- 


The SW loop counts to 'n' accumulationCycles, representing the measurement window. The number of timer counts within TA0R register represents the capacitance of the element.

Parameters
groupAddress of the structure describing the Sensor to be measured
countsAddress to where the measurements are to be written
Returns
none
void TI_CTS_fRO_COMPAp_TA0_SW_HAL ( const struct Sensor *  group,
uint16_t *  counts 
)

RO method capactiance measurement using CompA+, TimerA0, and SW loop.


Schematic Description of CompA+ forming relaxation oscillator.
<- Output
-> Input
R Resistor (typically 100Kohms)

                 +-<-Px.y (reference)
                 |
                 R
                 |
             +---+-->COMPA+
             |   |
             R   R                
             |   |
            GND  |
                 |  
                 +-->TACLK                     
                 |
    element-+-R--+-<-CAOUT                               
            |
           +------->COMPA- 


The timer counts to TA0CCR0 representing the measurement window. The number of counts within the SW loop that have accumulated during the measurement window represents the capacitance of the element.

Parameters
groupAddress of the structure describing the Sensor to be measured
countsAddress to where the measurements are to be written
Returns
none
void TI_CTS_fRO_COMPAp_TA1_SW_HAL ( const struct Sensor *  group,
uint16_t *  counts 
)

RO method capactiance measurement using CompA+, TimerA1, and SW loop.

     Schematic Description of CompA+ forming relaxation oscillator.


<- Output
-> Input
R Resistor (typically 100Kohms)

                  +-<-Px.y (reference)
                  |
                  R
                  |
              +---+-->COMPA+
              |   |
              R   R                
              |   |
             GND  |
                  |  
                  +-->TA1CLK                     
                  |
     element-+-R--+-<-CAOUT                               
             |
             +------->COMPA- 


The timer counts to TA1CCR0 representing the measurement window. The number of counts within the SW loop that have accumulated during the measurement window represents the capacitance of the element.

Parameters
groupAddress of the structure describing the Sensor to be measured
countsAddress to where the measurements are to be written
Returns
none
void TI_CTS_fRO_COMPB_TA0_SW_HAL ( const struct Sensor *  group,
uint16_t *  counts 
)

fRO method capactiance measurement using CompB, TimerA0


Schematic Description of CompB forming relaxation oscillator and coupling (connection) between the relaxation oscillator and TimerA0.
<- Output
-> Input
R Resistor (typically 100Kohms)

    element---+-R--<-CBOUT/TA1CLK
              |
              +---->CBx                               


The TAR reister value is the number of SW loops (function of MCLK) within n charge and discharge cycles. This value is directly proportional to the capacitance of the element measured. 'n' is defined by the variable accumulation_cycles.

Parameters
groupAddress of the structure describing the Sensor to be measured
countsAddress to where the measurements are to be written
Returns
none
void TI_CTS_fRO_COMPB_TA1_SW_HAL ( const struct Sensor *  group,
uint16_t *  counts 
)

fRO method capactiance measurement using CompB, TimerA1


Schematic Description of CompB forming relaxation oscillator and coupling (connection) between the relaxation oscillator and TimerA1.
<- Output
-> Input
R Resistor (typically 100Kohms)

     element---+-R--<-CBOUT/TA1CLK
               |
               +---->CBx                               


The TAR reister value is the number of SW loops (function of MCLK) within n charge and discharge cycles. This value is directly proportional to the capacitance of the element measured. 'n' is defined by the variable accumulation_cycles.

Parameters
groupAddress of the structure describing the Sensor to be measured
countsAddress to where the measurements are to be written
Returns
none
void TI_CTS_fRO_COMPB_TA1_TA0_HAL ( const struct Sensor *  group,
uint16_t *  counts 
)

fRO method capacitance measurement using CompB, TimerA1, and TimerA0

======== TI_CTS_fRO_COMPB_TA1_TA0_HAL() ======== /n Schematic Description of CompB forming relaxation oscillator and coupling (connection) between the relaxation oscillator and TimerA1. /n <- Output /n -> Input /n R Resistor (typically 100Kohms)

     element--+--R--<-CBOUT/TA1CLK
              |
              +----->-CBx

/n The TimerA1 interval represents the measurement window. The number of counts within TA0R that have accumulated during the measurement window represents the capacitance of the element.

Parameters
(group)pointer to the sensor to be measured
(counts)pointer to where the measurements are to be written
Returns
none

Allocate Context Save Variables Status Register: GIE bit only TIMERA0: TA0CTL, TA0CCTL0, TA0CCR0 TIMERA1: TA1CTL, TA1CCTL0, TA1CCR0 COMPB: CBCTL0,CBCTL1,CBCTL2,CBCTL3

void TI_CTS_fRO_CSIO_TA2_TA3_HAL ( const struct Sensor *  group,
uint16_t *  counts 
)

fRO using Capacitive Touch IO, TimerA2, and TimerA3

======== TI_CTS_RO_CSIO_TA2_TA3_HAL ========
Schematic Description:


element--—+->Px.y


The TimerA2 interval represents the measurement window. The number of counts within the TA3R that have accumulated during the measurement window represents the capacitance of the element.

Parameters
grouppointer to the sensor to be measured
countspointer to where the measurements are to be written
Returns
none
void TI_CTS_fRO_PINOSC_TA0_SW_HAL ( const struct Sensor *  group,
uint16_t *  counts 
)

fRO method capactiance measurement using the PinOsc and TimerA0

     Charge and Discharge Cycle 
                     + 
                 +    +
             +          +
          +                +
        +                     +
     Start Timer             After n cycles Stop Timer


The TAR reister value is the number of SW loops (function of MCLK) within n charge and discharge cycles. This value is directly proportional to the capacitance of the element measured. 'n' is defined by the variable accumulation_cycles.

Parameters
groupAddress of the structure describing the Sensor to be measured
countsAddress to where the measurements are to be written
Returns
none
void TI_CTS_fRO_PINOSC_TA0_TA1_HAL ( const struct Sensor *  group,
uint16_t *  counts 
)

fRO method capacitance measurement using PinOsc IO, TimerA0, and TimerA1


Schematic Description:


element--—+->Px.y


The TimerA0 interval represents the measurement window. The number of counts within the TA1R that have accumulated during the measurement window represents the capacitance of the element.

Parameters
groupPointer to the structure describing the Sensor to be measured
countsPointer to where the measurements are to be written
Returns
none
void TI_CTS_RC_PAIR_TA0_HAL ( const struct Sensor *  group,
uint16_t *  counts 
)

RC method capactiance measurement using a Pair of GPIO and TimerA0.

     Schematic Description of two GPIO forming RC measruement.


<- Output
-> Input
R Resistor (typically 1Mohms)

                 +-<-Px.y (reference)
                 |
                 R
                 |
       Element---+-->Pa.b                               

       Charge and Discharge Cycle
                    + 
                +    +
             +          +
           +                +
          +                     +


Start Timer After n cycles Stop Timer The TAR reister value is the number of SMCLK periods within n charge and discharge cycles. This value is directly proportional to the capacitance of the element measured. 'n' is defined by the variable accumulation_cycles.

Parameters
groupAddress of the structure describing the Sensor to be measured
countsAddress to where the measurements are to be written
Returns
none
void TI_CTS_RO_COMPAp_TA0_WDTp_HAL ( const struct Sensor *  group,
uint16_t *  counts 
)

RO method capactiance measurement using CompA+, TimerA0, and WDT+.


Schematic Description of CompA+ forming relaxation oscillator and coupling (connection) between the relaxation oscillator and TimerA0.
<- Output
-> Input
R Resistor (typically 100Kohms)

                 +-<-Px.y (reference)
                 |
                 R
                 |
             +---+-->COMPA+
             |   |
             R   R                
             |   |
            GND  |
                 |                       
                 +-->TACLK
                 |
    element-+-R--+-<-CAOUT                               
            |
            +------->COMPA- 


The WDT+ interval represents the measurement window. The number of counts within the TA0R that have accumulated during the measurement window represents the capacitance of the element.

Parameters
groupAddress of the structure describing the Sensor to be measured
countsAddress to where the measurements are to be written
Returns
none
void TI_CTS_RO_COMPAp_TA1_WDTp_HAL ( const struct Sensor *  group,
uint16_t *  counts 
)

RO method capactiance measurement using CompA+, TimerA1, and WDT+.


Schematic Description of CompA+ forming relaxation oscillator and coupling (connection) between the relaxation oscillator and TimerA0.
<- Output
-> Input
R Resistor (typically 100Kohms)

                  +-<-Px.y (reference)
                  |
                  R
                  |
                  +---+-->COMPA+
                  |   |
                  R   R                
                  |   |
                 GND  |
                      |                       
                      +-->TA1CLK
                      |
         element-+-R--+-<-CAOUT                               
                      |
                      +------->COMPA- 


The WDT+ interval represents the measurement window. The number of counts within the TA0R that have accumulated during the measurement window represents the capacitance of the element.

Parameters
groupAddress of the structure describing the Sensor to be measured
countsAddress to where the measurements are to be written
Returns
none
void TI_CTS_RO_COMPB_TA0_WDTA_HAL ( const struct Sensor *  group,
uint16_t *  counts 
)

RO method capactiance measurement using CompB, TimerA0, and WDTA.


Schematic Description of CompB forming relaxation oscillator and coupling (connection) between the relaxation oscillator and TimerA0.
<- Output
-> Input
R Resistor (typically 100Kohms)

      element---+-R--<-CBOUT/TA1CLK
                |
                +---->CBx                              


The WDTA interval represents the measurement window. The number of counts within the TA0R that have accumulated during the measurement window represents the capacitance of the element.

Parameters
groupAddress of the structure describing the Sensor to be measured
countsAddress to where the measurements are to be written
Returns
none
void TI_CTS_RO_COMPB_TA1_TA0_HAL ( const struct Sensor *  group,
uint16_t *  counts 
)

RO method capacitance measurement using CompB, TimerA1, and TimerA0.

======== TI_CTS_RO_COMPB_TA1_TA0_HAL =======
Schematic Description of CompB forming relaxation oscillator and
coupling (connection) between the relaxation oscillator and TimerA1.
<- Output
-> Input
R Resistor (typically 100Kohms)

     element--+--R--<-CBOUT/TA1CLK
              |
              +----->-CBx


The TimerA0 interval represents the measurement window. The number of counts within TA1R that have accumulated during the measurement window represents the capacitance of the element.

Parameters
grouppointer to the sensor to be measured
countspointer to where the measurements are to be written
Returns
none

Allocate Context Save Variables Status Register: GIE bit only TIMERA0: TA0CTL, TA0CCTL0, TA0CCR0 TIMERA1: TA1CTL, TA1CCTL0, TA1CCR0 COMPB: CBCTL0,CBCTL1,CBCTL2,CBCTL3

void TI_CTS_RO_COMPB_TA1_WDTA_HAL ( const struct Sensor *  group,
uint16_t *  counts 
)

RO method capactiance measurement using CompB, TimerA1, and WDTA.


Schematic Description of CompB forming relaxation oscillator and coupling (connection) between the relaxation oscillator and TimerA1.
<- Output
-> Input
R Resistor (typically 100Kohms)

    element---+-R--<-CBOUT/TA1CLK
              |
              +---->CBx 


The WDTA interval represents the measurement window. The number of counts within the TA1R that have accumulated during the measurement window represents the capacitance of the element.

Parameters
groupAddress of the structure describing the Sensor to be measured
countsAddress to where the measurements are to be written
Returns
none
void TI_CTS_RO_COMPB_TB0_WDTA_HAL ( const struct Sensor *  group,
uint16_t *  counts 
)

RO method capactiance measurement using CompB, TimerB0, and WDTA.

======== TI_CTS_RO_COMPB_TB0_WDTA_HAL ========
Schematic Description of CompB forming relaxation oscillator and coupling (connection) between the relaxation oscillator and TimerA0.
<- Output
-> Input
R Resistor (typically 100Kohms)


element—R-—<-CBOUT/TB0CLK


The WDTA interval represents the measurement window. The number of counts within the TB0R that have accumulated during the measurement window represents the capacitance of the element.

Parameters
grouppointer to the sensor to be measured
countspointer to where the measurements are to be written
Returns
none
void TI_CTS_RO_CSIO_TA2_TA3_HAL ( const struct Sensor *  group,
uint16_t *  counts 
)

RO method using Capacitive Touch IO, TimerA2, and TimerA3.

======== TI_CTS_RO_CSIO_TA2_TA3_HAL ========
Schematic Description:
element--—+->Px.y


The TimerA3 interval represents the measurement window. The number of counts within the TA2R that have accumulated during the measurement window represents the capacitance of the element.

Parameters
grouppointer to the sensor to be measured
countspointer to where the measurements are to be written
Returns
none
void TI_CTS_RO_CSIO_TA2_WDTA_HAL ( const struct Sensor *  group,
uint16_t *  counts 
)

RO method measurement using Capacitive Touch IO, TimerA2, and WDTA.

======== TI_CTS_RO_CSIO_TA2_WDTA_HAL ========
Schematic Description:


element--—+->Px.y


The WDTA interval represents the measurement window. The number of counts within the TA2R that have accumulated during the measurement window represents the capacitance of the element.

Parameters
grouppointer to the sensor to be measured
countspointer to where the measurements are to be written
Returns
none
void TI_CTS_RO_PINOSC_TA0_HAL ( const struct Sensor *  group,
uint16_t *  counts 
)

RO method capactiance measurement using PinOsc IO, and TimerA0.


Schematic Description:


element--—+->Px.y


The measurement window is accumulation_cycles/ACLK. The ACLK is used to generate a capture event via the internal connection CCIOB. The counts within the TA0R that have accumulated during the measurement window represents the capacitance of the element.

Parameters
groupPointer to the structure describing the Sensor to be measured
countsPointer to where the measurements are to be written
Returns
none
void TI_CTS_RO_PINOSC_TA0_TA1_HAL ( const struct Sensor *  group,
uint16_t *  counts 
)

RO method capacitance measurement using PinOsc IO, TimerA0, and TimerA1.

======== TI_CTS_RO_PINOSC_TA0_TA1_HAL ========
Schematic Description:


element–—+->Px.y


The TimerA1 interval represents the gate (measurement) time. The number of oscillations that have accumulated in TA0R during the measurement time represents the capacitance of the element.

Parameters
grouppointer to the sensor to be measured
countspointer to where the measurements are to be written
Returns
none

Allocate Context Save Variables Status Register: GIE bit only TIMERA0: TA0CTL, TA0CCTL0, TA0CCR0 TIMERA1: TA1CTL, TA1CCTL0, TA1CCR0 Ports: PxSEL, PxSEL2

The measGateSource represents the gate source for timer TIMERA1, which can be sourced from TACLK, ACLK, SMCLK, or INCLK. The interrupt handler is defined in TIMER1_A0_VECTOR, which simply clears the low power mode bits in the Status Register before returning from the ISR.

void TI_CTS_RO_PINOSC_TA0_WDTp_HAL ( const struct Sensor *  group,
uint16_t *  counts 
)

RO method capactiance measurement with PinOsc IO, TimerA0, and WDT+.


Schematic Description:


element--—+->Px.y


The WDT+ interval represents the measurement window. The number of counts within the TA0R that have accumulated during the measurement window represents the capacitance of the element.

Parameters
groupPointer to the structure describing the Sensor to be measured
countsPointer to where the measurements are to be written
Returns
none